Description
Pattern recognition presents one of the most significant challenges for scientists and engineers, and many different approaches have been proposed. The aim of this book is to provide a self-contained account of probabilistic analysis of these approaches. The book includes a discussion of distance measures, nonparametric methods based on kernels or nearest neighbors, Vapnik-Chervonenkis theory, epsilon entropy, parametric classification, error estimation, free classifiers, and neural networks. Wherever possible, distribution-free properties and inequalities are derived. A substantial portion of the results or the analysis is new. Over 430 problems and exercises complement the material. Zusammenfassung Pattern recognition presents a significant challege for scientists and engineers, and many different approaches have been proposed. This book provides a self-contained account of probabilistic techniques that have been applied to the subject. Researchers and graduate students will benefit from this wide-ranging account of the field.
Erscheinungsjahr: | 1996 |
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Fachbereich: | Wahrscheinlichkeitstheorie |
Genre: | Importe, Mathematik |
Rubrik: | Naturwissenschaften & Technik |
Medium: | Buch |
Inhalt: | xv 638 S. |
ISBN-13: | 9780387946184 |
ISBN-10: | 0387946187 |
Sprache: | Englisch |
Einband: | Gebunden |
Autor: | Devroye, Luc Lugosi, Gabor Györfi, Laszlo |
Hersteller: | Springer New York Springer US, New York, N.Y. |
Verantwortliche Person für die EU: | |
Maße: | 241 x 160 x 40 mm |
Von/Mit: | Luc Devroye (u. a.) |
Erscheinungsdatum: | 04.04.1996 |
Gewicht: | 1,144 kg |
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